Our engineers are highly skillful in finding solutions for custom applications that require expertise in diagnostics. Whether it is an application of our technologies or your technology requires our expertise, we will be happy to provide you our help and develop a solution that will fully integrate into your system. We also provide services for performing on-site tests and measurements. Our experienced engineers can perform a variety measurement tasks using a custom or standard diagnostic system.

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November 12th 2008
Lenterra in collaboration with Univercity of Mariland was selected for NSF SBIR Phase I award: "Shear Stress Sensor Based on Optical Micro-Spring Technology."

September 2008
Company has received Bridge Grant from New Jersey Commission on Science and Technology to develop environmental sensor based on PIES technology.

August 15th 2008
Lenterra has been selected for DOE SBIR Phase II award: "A Cost-Effective Analytical Technology for Identification and Measurement of Greenhouse Gases."

June 24th 2008
Lenterra has been awarded Seed Grant by New Jersey Commission on Science and Technology for the development of shear stress sensor based on OMS technology.

November 14th 2007
Company has received a NSF SBIR phase I award for the development of micro-sensor based on PIES technology.

July 3rd 2007
Lenterra has been awarded DOE SBIR phase I contract for the development of environmental sensor based on PIES technology.

March 29th 2006
Lenterra's PIES technology is featured in Chemical and Engineering News.

November 10th 2005
Lenterra in collaboration with Polytechnic University was selected for NSF STTR phase I award: "Distributed Micro-Optical Sensor Technology for Temperature, Pressure and Strain Measurements."

October 5th 2005
Lenterra was selected for NASA SBIR phase II award on development of plasma detectors for Gas Chromatography: "Fast GC for Space Applications Based on PIES Technology."
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